Patents Held by Sciaky, Inc

Backscatter Detection; Electron Beam Layer Manufacturing Using Scanning Electron Monitored Closed Loop Control

• 8,598,523 (US)
• 8,809,780 (US)
• 2010318559 (AU)
• 2498935 (EP)
• 2498935 (DE)
• 2498935 (FR)
• 2498935 (GB)

CLC Camera; Electron Beam Layer Manufacturing

• 8,546,717 (US)
• 9,399,264 (US)
• 10,189,114 (US)
• 11,344,967 (US)
• 2010295585 (AU)
• 2477768 (EP)
• 2477768 (DE)
• 2477768 (FR)
• 2477768 (GB)

Dynamic Raster; Raster Methodology, Apparatus, and System for Electron Beam Layer Manufacturing Using Closed Loop Control

• 8,461,474 (US)
• 9,174,300 (US)
• 10,071,437 (US)
• 10,946,474 (US)
• 2011233678 (AU)
• 2555902 (EP)
• 2555902 (DE)
• 2555902 (FR)
• 2555902 (GB)