Patents Held by Sciaky, Inc
Backscatter Detection; Electron Beam Layer Manufacturing Using Scanning Electron Monitored Closed Loop Control
- 8,598,523 (US)
- 8,809,780 (US)
- 2010318559 (AU)
- 2498935 (EP)
- 2498935 (DE)
- 2498935 (FR)
- 2498935 (GB)
CLC Camera; Electron Beam Layer Manufacturing
- 8,546,717 (US)
- 9,399,264 (US)
- 10,189,114 (US)
- 11,344,967 (US)
- 2010295585 (AU)
- 2477768 (EP)
- 2477768 (DE)
- 2477768 (FR)
- 2477768 (GB)
Dynamic Raster; Raster Methodology, Apparatus, and System for Electron Beam Layer Manufacturing Using Closed Loop Control
- 8,461,474 (US)
- 9,174,300 (US)
- 10,071,437 (US)
- 10,946,474 (US)
- 2011233678 (AU)
- 2555902 (EP)
- 2555902 (DE)
- 2555902 (FR)
- 2555902 (GB)
